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On the design of combinational totally self-checking 1-out-of-3 code checkers

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2 Author(s)
Lo, J.-C. ; Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA ; Thanawastien, S.

The authors present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker. The checker is totally self-checking (TSC) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a sufficient level of safety for some implementations

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Computers, IEEE Transactions on  (Volume:39 ,  Issue: 3 )