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Browse Journals & Magazines > Applied Physics Letters ...> Volume:67 Issue:1 Help

Electrical properties and microstructures of Au/Pt/Ti/Ni ohmic contacts to p‐type ZnTe

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7 Author(s)
Mochizuki, K. ; Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo 185, Japan ; Terano, A. ; Momose, Masayuki ; Taike, Akira
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Electrical properties and microstructures of Au/Pt/Ti/Ni ohmic contacts to p‐type ZnTe were investigated using the transmission line model method and cross‐sectional transmission electron microscopy. The specific contact resistance decreases when the annealing temperature is increased and reaches a minimum at 300 °C. The formation of NiTe2 from the reaction between Ni and ZnTe plays an important role in lowering the contact resistance. A contact stability test performed at 102 °C suggests that these ohmic contacts are stable even under high‐current injection. © 1995 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:67 ,  Issue: 1 )

Date of Publication: Jul 1995

Page(s):
112 - 114
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.115500
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Jul 1995

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