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Controlled manipulation of nanoparticles with an atomic force microscope

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4 Author(s)
Junno, T. ; Department of Solid State Physics and Nanometer Structure Consortium, Lund University, Box 118, S‐221 00 Lund, Sweden ; Deppert, K. ; Montelius, L. ; Samuelson, L.

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We report on the application of the atomic force microscope (AFM) to manipulate and position nanometer‐sized particles with nanometer precision. The technique, which can be regarded as a nanometer‐scale analogy to atomic level manipulation with the scanning tunneling microscope, allowed us to form arbitrary nanostructures, under ambient conditions, by controlled manipulation of individual 30 nm GaAs particles. A whole new set of nanodevices can be fabricated particle‐by‐particle for studies of quantum effects and single electron tunneling. We also demonstrate a method, based on the AFM manipulation, to determine the true lateral dimensions of nano‐objects, in spite of the tip‐sample convolution. © 1995 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:66 ,  Issue: 26 )

Date of Publication:

Jun 1995

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