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Transport properties in Tl‐Ba‐Ca‐Cu‐O grain boundary junctions on SrTiO3 bicrystal substrates

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4 Author(s)
Sarnelli, E. ; IBM T. J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598 ; Chaudhari, P. ; Lee, W.Y. ; Esposito, E.

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We have investigated the electrical properties of Tl‐Ba‐Ca‐Cu‐O high‐Tc superconductor bicrystal grain boundary junctions. The behavior of the transport parameters is very similar to those obtained in YBaCuO7-δ junctions. In particular, the temperature dependence of the critical current and the scaling behavior of the critical current density as a function of the misorientation angle were analyzed. Relatively good control of the transport parameters as a function of the misorientation angle has been achieved. The current‐voltage characteristics showed a resistively shunted junction model‐like behavior at large angles (θ≥20°); at lower angles, the characteristics were more flux‐flow like. Preliminary results on noise characteristics are also presented.

Published in:
Applied Physics Letters  (Volume:65 ,  Issue: 3 )

Date of Publication: Jul 1994

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