Close category search window
 

Charge sensitivity of a single electron transistor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hanke, Ulrik ; Division of Physics, Department of Physics and Mathematics, Norwegian Institute of Technology, The University of Trondheim, N 7034 Trondheim, Norway ; Galperin, Yu.M. ; Chao, K.A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.112862 

The charge sensitivity of a capacitive‐coupled single electron transistor (SET) has been investigated with analytical and numerical calculations. We found that by tuning the gate charge and the asymmetry of the conductances, the transconductance‐to‐noise ratio can be largely increased. With the present available fabrication technology, our theoretical analysis can serve as a guidance for optimizing the charge sensitivity of a SET. © 1994 American Institue of Physics.

Published in:
Applied Physics Letters  (Volume:65 ,  Issue: 14 )

Date of Publication: Oct 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.