Cart (Loading....) | Create Account
Close category search window

Simultaneous scanning tunneling microscope and collection mode scanning near‐field optical microscope using gold coated optical fiber probes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Garcia‐Parajo, M. ; Laboratoire de Microstructures et de Microélectronique, CNRS, BP107, 196 Avenue Henri Ravera, 92225 Bagneaux, France ; Cambril, E. ; Chen, Y.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Simultaneous scanning tunneling microscope (STM) and collection mode scanning near‐field optical microscope (SNOM) images using tunneling regulation are presented. The images were obtained using a gold coated single optical fiber as both a tunneling and near‐field optical probe. The method counts on the reliable STM distance regulation and the short separation between tip and sample (≪1 nm). Using optimized fiber probes, both STM and SNOM images show good resolution and image contrast. We describe the STM/SNOM system and present the first images obtained in the collection mode with calibration samples of gratings of period down to 200 nm.

Published in:

Applied Physics Letters  (Volume:65 ,  Issue: 12 )

Date of Publication:

Sep 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.