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Laser spectral linewidth dependence on waveguide loss measurements using the Fabry–Perot method

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5 Author(s)
Yu, L.S. ; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California, 92093‐0407 ; Liu, Q.Z. ; Pappert, S.A. ; Yu, P.K.L.
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The critical role of the optical source spectral linewidth in semiconductor low loss waveguide measurements using the Fabry–Perot resonance method is analyzed. For 5‐mm‐long GaAs/AlGaAs waveguides with losses in the 1 dB/cm range, a frequency stabilized single mode laser with a linewidth of less than 0.01 Å is required to obtain a loss value accurate to within 5%.

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Applied Physics Letters  (Volume:64 ,  Issue: 5 )