By Topic

Laser spectral linewidth dependence on waveguide loss measurements using the Fabry–Perot method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Yu, L.S. ; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California, 92093‐0407 ; Liu, Q.Z. ; Pappert, S.A. ; Yu, P.K.L.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.111095 

The critical role of the optical source spectral linewidth in semiconductor low loss waveguide measurements using the Fabry–Perot resonance method is analyzed. For 5‐mm‐long GaAs/AlGaAs waveguides with losses in the 1 dB/cm range, a frequency stabilized single mode laser with a linewidth of less than 0.01 Å is required to obtain a loss value accurate to within 5%.

Published in:

Applied Physics Letters  (Volume:64 ,  Issue: 5 )