By Topic

A low-power 1 MHz, 25 mW 12-bit time-interleaved analog-to-digital converter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mayes, Michael K. ; Nat. Semicond. Corp., Santa Clara, CA, USA ; Chin, Sing W. ; Stoian, L.L.

A 12-bit 1 Msample/s 25 mW analog-to-digital converter was designed. Linearity, offset, and gain errors of less than 1/2 LSB have been achieved using an EEPROM memory trimming scheme. The EEPROM memory array, programmed during testing, continuously drives a correction digital-to-analog converter (DAC) with code dependent correction factors. The analog-to-digital converter (ADC) uses a time-interleaved multistep architecture consisting of two banks of comparator arrays sharing a common reference ladder and EEPROM correction memory. A static EEPROM memory array optimizes the power dissipation, conversion rate, inter-stage gain errors, and charge injection. The resulting converter achieves high speed operation with minimal power dissipation

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:31 ,  Issue: 2 )