Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.106940
A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near‐field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near‐field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near‐field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.