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Combined shear force and near‐field scanning optical microscopy

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3 Author(s)
Betzig, E. ; AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974 ; Finn, P.L. ; Weiner, J.S.

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A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near‐field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near‐field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near‐field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.

Published in:

Applied Physics Letters  (Volume:60 ,  Issue: 20 )