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Comment on “Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy” [Appl. Phys. Lett. 86, 042104 (2005)]

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1 Author(s)
Lin, Yow-Jon ; Institute of Photonics, National Changhua University of Education, Changhua 500, Taiwan, Republic of China

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Published in:

Applied Physics Letters  (Volume:86 ,  Issue: 21 )