Cart (Loading....) | Create Account
Close category search window
 

Domain rearrangement during nanoindentation in single-crystalline barium titanate measured by atomic force microscopy and piezoresponse force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Schneider, G.A. ; Advanced Ceramics Group, Hamburg University of Technology, Hamburg, Germany ; Scholz, T. ; Munoz-Saldana, J. ; Swain, M.V.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1920410 

Nanoindentation tests in an aa-in-plane domain area of an {001} oriented barium titanate single crystal were performed using a conical indenter with a tip radius of 800 nm. The topography and the polarization vectors of the area after indentation were imaged afterwards by both atomic force and piezoresponse force microscopy (PFM), respectively. Two perpendicular oriented cracks in the {110} planes were identified in the topographic image. An unexpected considerable uplift occurs inside the residual impression, which was correlated with a sharp pop-out-like behavior observed in the force-displacement curve just prior to unloading. Furthermore, PFM revealed an almost a twofold symmetric arrangement of the domains around the indent, which can be explained by residual circumferential tensile stresses around a residual impression and was unambiguously correlated to the crystal orientation.

Published in:

Applied Physics Letters  (Volume:86 ,  Issue: 19 )

Date of Publication:

May 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.