An AlN/GaN multiple-barrier resonant-tunneling electron emitter is proposed in this letter, utilizing polarization fields in the AlN/GaN heterostructure. The resonant-tunneling voltage is extremely high, compared with usual resonant-tunneling devices, due to the polarization field in the heterostructure, and this high resonant voltage enables practical use of the devices. Selective and high-density electron emission is to be expected through the resonant-tunneling layer and GaN surface accelerating layer.
Published in:
Applied Physics Letters
(Volume:86
,
Issue:
18
)
Date of Publication:
May 2005
- Page(s):
-
183102
-
183102-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.1922081
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
May 2005