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Epitaxial nature and anisotropic dielectric properties of (Pb,Sr)TiO3 thin films on NdGaO3 substrates

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8 Author(s)
Lin, Y. ; Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 ; Chen, X. ; Liu, S.W. ; Chen, C.L.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1897078 

Epitaxial behavior of (Pb,Sr)TiO3 thin films on (110) NdGaO3 substrates fabricated in different conditions have been investigated using high resolution x-ray diffraction and characterized with interdigital dielectric measurement. A slow cooling results in films with a-axis normal to the surface (a-axis growth), whereas a fast cooling leads to growth of c-axis oriented films. The dielectric properties of the films prepared under different cooling rates are closely related to the crystalline structure of the films.

Published in:

Applied Physics Letters  (Volume:86 ,  Issue: 14 )

Date of Publication:

Apr 2005

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