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Conductance measurement of a DNA network in nanoscale by point contact current imaging atomic force microscopy

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6 Author(s)
Terawaki, Ayumu ; The Institute of Science and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan ; Otsuka, Yoichi ; Lee, Heayeon ; Matsumoto, Takuya
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We measured the electrical conductivity of a DNA network as a spatially-resolved current-image using point-contact current imaging atomic force microscopy (PCI-AFM) under various humidity conditions. The simultaneous observation of topography and current image by PCI-AFM can provide information pertaining to the electrical properties of biological and/or soft materials in the nano-scale range. Under dry condition (0% humidity), no difference was observed for the electrical current both of the DNA network and mica surface, whereas the electrical current along the DNA network was larger than that of the mica surface by 20 pA at a bias voltage of 5 V under high humidity conditions of 60%.

Published in:

Applied Physics Letters  (Volume:86 ,  Issue: 11 )

Date of Publication:

Mar 2005

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