By Topic

Uniform field-induced strain in a/b-axes-oriented Bi3.9Pr0.1Ti3O12 thick films on IrO2/Si substrates for lead-free piezoelectric microdevice applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Matsuda, Hirofumi ; Research Institute of Instrumentation Frontier, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba 305-8568, Japan ; Ito, Sachiko ; Iijima, Takashi

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We grew 1.5-μm-thick Bi3.9Pr0.1Ti3O12 (BPT) polycrystalline films with a/b-axes orientation on IrO2/Si substrates from chemical solutions and measured electric-field-induced strain Є by a double-beam laser doppler vibrometer and atomic-force microscopy (AFM). The results reflected uniform film growth and elimination of elastic deformation of the substrate, and the microscopic piezoelectric response in AFM measurements agreed well with the macroscopic response evaluated by laser vibrometer. A large longitudinal Є=0.3% was observed at 400 kV/cm and 10 Hz, and the piezoelectric coefficient d33=dЄ/dE|0=60 pm/V was calculated. X-ray diffraction analyses revealed that the (200)/(020) peak of BPT was comprised of 40% a domain and led to the reduced values of ferroelectric polarizations of 2Pr=35 and Psat=23 μC/cm2. This suggests that applying an electric field did not cause fraction reconfiguration of a- and b-domains, and, therefore, the measured large strain was achieved without contribution from the 90°-domain-wall motion in a/b-axes-oriented BPT thick films.

Published in:

Applied Physics Letters  (Volume:85 ,  Issue: 7 )