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Dielectric characteristics of nanocrystalline AgBa0.5Sr0.5TiO3 composite thin films

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3 Author(s)
Jayadevan, K.P. ; Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu 300, Taiwan, Republic of China ; Liu, C.Y. ; Tseng, T.Y.

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Nanocrystalline AgBa0.5Sr0.5TiO3 (Ag–BST) composite thin films are deposited on Pt/Ti/SiO2/Si substrates by a sol-gel method. The voltage-dependent capacitance (C–V) and dielectric loss of the films decrease with increasing Ag up to 2 mol % due to a series configuration involving low dielectric interface layers and dense microstructures. The evidence for asymmetric distribution of charge carriers in the Ag–BST film is derived from C–V measurements. The dielectric tunability of BST film with 1 mol % Ag is comparable to that of pure BST.

Published in:

Applied Physics Letters  (Volume:85 ,  Issue: 7 )

Date of Publication:

Aug 2004

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