Cart (Loading....) | Create Account
Close category search window

Internal light source technique free from reabsorption losses for optical characterization of planar photonic crystals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)
Lombardet, B. ; Institut de Photonique et d’Electronique Quantique, École Polytechnique Fédérale, CH-1015 Lausanne, Switzerland ; Ferrini, R. ; Dunbar, L.A. ; Houdre, R.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

An optimization of the internal light source (ILS) technique for optical characterization of planar photonic crystals (PPhCs) is presented. The approach makes use of a double planar waveguide structure that separates the region where the light emitting layers are embedded from the region where the PPhCs are fabricated. This technique is demonstrated to be free from reabsorption losses, thus combining the advantages of standard optical techniques with the versatility of the ILS setup. We validate this method by comparison with standard ILS measurements on several PPhC structures.

Published in:

Applied Physics Letters  (Volume:85 ,  Issue: 22 )

Date of Publication:

Nov 2004

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.