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High-resolution domain imaging on the nonpolar y-face of periodically poled KTiOPO4 by means of atomic force microscopy

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4 Author(s)
Canalias, C. ; Department of Physics, Royal Institute of Technology, SE-10044 Stockholm, Sweden ; Pasiskevicius, V. ; Fragemann, A. ; Laurell, F.

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The inverse piezoelectric effect is used to produce high-resolution images of ferroelectric domains in periodically poled KTiOPO4 crystals on their nonpolar y-face using atomic force microscopy. We demonstrate that the technique is convenient for studying the nucleation and growth of domains in a periodically poled KTiOPO4 sample. © 2003 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:83 ,  Issue: 4 )