By Topic

High-resolution domain imaging on the nonpolar y-face of periodically poled KTiOPO4 by means of atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Canalias, C. ; Department of Physics, Royal Institute of Technology, SE-10044 Stockholm, Sweden ; Pasiskevicius, V. ; Fragemann, A. ; Laurell, F.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The inverse piezoelectric effect is used to produce high-resolution images of ferroelectric domains in periodically poled KTiOPO4 crystals on their nonpolar y-face using atomic force microscopy. We demonstrate that the technique is convenient for studying the nucleation and growth of domains in a periodically poled KTiOPO4 sample. © 2003 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:83 ,  Issue: 4 )