Cart (Loading....) | Create Account
Close category search window

Exciton spin relaxation time in quantum dots measured by continuous-wave photoluminescence spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Mackowski, S. ; Department of Physics, University of Cincinnati, Cincinnati, Ohio 24551-0011 ; Nguyen, T.A. ; Jackson, H.E. ; Smith, L.M.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We demonstrate a method of measuring the exciton spin relaxation time in semiconductor nanostructures by continuous-wave photoluminescence. We find that for self-assembled CdTe quantum dots (QDs) the degree of circular polarization of emission is larger when exciting polarized excitons into the lower energy spin state --polarized) than in the case when the excitons are excited into the higher energy spin state +-polarized). A simple rate equation model gives the exciton spin relaxation time in CdTe QDs equal to τS=4.8±0.3 ns, significantly longer than the QD exciton recombination time τR=300 ps. © 2003 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:83 ,  Issue: 26 )

Date of Publication:

Dec 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.