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Atomic-scale depth selectivity of soft x-ray resonant Kerr effect

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3 Author(s)
Lee, Ki-Suk ; Nanospintronics Laboratory, School of Materials Science and Engineering, and Research Institute of Advanced Materials, College of Engineering, Seoul National University, Seoul 151-744, Korea ; Kim, Sang-Koog ; Kortright, J.B.

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By the use of resonant soft x-ray Kerr rotation measurements with its varying incident angle and energy, we observed various shifts of the exchange bias field of a 3.5-nm-thick Co layer in oppositely exchange-biased Ni81Fe19/Fe50Mn50/Co/Pd films. The results in conjunction with their model simulations clearly reveal that the measurements enable one to resolve varying magnetization with depth in the individual magnetic layers of such a multicomponent ultrathin layered structure on the atomic scales. Significant interference effects combined with penetration depth of resonant soft x rays, which are closely associated with their absorptive and refractive contributions, offer remarkably different depth sensitivities into the Kerr effects depending on grazing angle and resonance energy. © 2003 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:83 ,  Issue: 18 )

Date of Publication:

Nov 2003

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