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Mixing characteristics of InGaAs metal–semiconductor–metal photodetectors with Schottky enhancement layers

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6 Author(s)
Shen, H. ; US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 ; Aliberti, K. ; Stann, B. ; Newman, P.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1579117 

We report on the optoelectronic (OE) mixing characteristics of a Schottky-enhanced InGaAs-based metal–semiconductor–metal photodetector (MSM–PD). The measured frequency bandwidth of such a mixer is less than that of a corresponding photodetector. The mixing efficiency depends on the light modulation, local oscillator, and mixed signal frequencies and decreases nonlinearly with decrease in optical power. This is not observed in GaAs-based and non-Schottky-enhanced InGaAs MSM–PDs. We present a circuit model of the OE mixer to explain the experimental results. © 2003 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:82 ,  Issue: 22 )

Date of Publication: Jun 2003

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