By Topic

Determination of radiation exposure history of common materials and computer hardware by using atomic (and magnetic force) microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sharma, J. ; Carderock Division, Naval Surface Warfare Center, Bethesda, Maryland 20817 ; Teter, J.P. ; Abbundi, R.J. ; Guardala, N.A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1565184 

Defects produced by ionizing radiation are smaller than a micrometer and are unobservable in an optical microscope. An atomic force microscope was utilized to reveal their counts and structure in common materials like mica, silicon, organic solids, polymers, sugar, quartz, and calcite. A magnetic force microscope has shown the damage of radiation on computer hard disks. The present work shows that exposure to radioactive material leaves a permanent record, which can be read for dosimetric or forensic purposes by using atomic force microcopy on common objects or a magnetic force microscope on magnetic media.

Published in:

Applied Physics Letters  (Volume:82 ,  Issue: 14 )