Cart (Loading....) | Create Account
Close category search window
 

Different components of far-infrared photoresponse of quantum Hall detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kalugin, N.G. ; Institut für Technische Physik, TU-Braunschweig, Mendelssohnstrasse 2, D-38106 Braunschweig, Germany ; Nachtwei, G. ; Vasilyev, Y.B. ; Suchalkin, S.D.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1492315 

We have performed time-resolved measurements of the far-infrared photoresponse of two-dimensional electron systems in the quantum Hall regime. The photoresponse consists of two equally important components: the longitudinal component, caused by the photoinduced change of the longitudinal resistance Rxx, and the transversal component, caused by the photoinduced Hall currents and by the photoinduced change of Rxy. Both these components are connected with two mechanisms of the photoresponse: a nonresonant bolometric, and a cyclotron-resonant contribution. © 2002 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:81 ,  Issue: 2 )

Date of Publication:

Jul 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.