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Built-in test maturation concepts using test program set and relational database technologies

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1 Author(s)
Sudolsky, M.D. ; C-17 Autom. Test Syst., McDonnell Douglas Aerosp., Long Beach, CA, USA

Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed

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Aerospace and Electronic Systems Magazine, IEEE  (Volume:11 ,  Issue: 3 )