By Topic

Spatially resolved derivative spectroscopy of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Bradford, W.C. ; Physics Department, Colorado School of Mines, Golden, Colorado 80401 ; Beach, J.D. ; Collins, R.T. ; Kisker, D.W.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1448861 

A near-field scanning optical microscope was used in collection mode to generate spatially resolved maps of the first derivative with respect to operating current of power emission from vertical-cavity surface-emitting lasers (VCSELs). This technique is highly sensitive to the formation of new modes and can be used to identify mode cutoff points. An example of the usefulness of this technique is demonstrated as we estimate the index of refraction profile of the VCSEL under study at the single mode cutoff point. This profile is a primary feature of the waveguiding characteristics of such lasers. © 2002 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:80 ,  Issue: 6 )