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Experimental characterization of transmission lines in thin-film multichip modules

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4 Author(s)
S. Lipa ; Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA ; M. B. Steer ; A. C. Cangellaris ; P. D. Franzon

Signal propagation on transmission lines fabricated in thin polyimide films on silicon substrates is investigated. Series resistive and shunt conductive losses are separated and it is shown that the effective dielectric loss is much higher than that expected from bulk material properties

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IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A  (Volume:19 ,  Issue: 1 )