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Electrostatic force microscopy using a quartz tuning fork

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3 Author(s)
Seo, Yongho ; Center for Near-field Atom-Photon Technology and School of Physics, Seoul National University, Seoul 151-742, Korea ; Jhe, Wonho ; Seong Hwang, Cheol

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We demonstrate an electrostatic force microscopy based on a quartz tuning fork with 50 nm spatial resolution and 1 pN force sensitivity. We use a tuning fork with a spring constant of 1300 N/m and a Q factor of 3000. A sharpened nickel tip is attached to a prong of the tuning fork as well as electrically connected to the electrode of the prong. By applying a dc bias to the tip, ferroelectric domain patterns are recorded and read out on piezoelectric thin film. © 2002 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:80 ,  Issue: 23 )