By Topic

Surface-force measurement with a laser-trapped microprobe in solution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ota, Taisuke ; Department of Applied Physics, Osaka University, Suita, Osaka 565-0871, Japan ; Sugiura, Tadao ; Kawata, S.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1468267 

Surface force between a micron-sized polystyrene and dielectric substrate in solution has been analyzed by measuring the displacement of the laser-trapped probe. The amount of displacement is measured by detecting the intensity of light scattering at the probe illuminated by evanescent field. The sensitivity of 27 fN and the range of 5.2 pN have been achieved in the experiment with various concentrations of electrolyte trisaminomethane. The distribution of the surface force of 3-aminopropyltriethoxysilane coated on the glass substrate was also detected. © 2002 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:80 ,  Issue: 18 )