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Surface force between a micron-sized polystyrene and dielectric substrate in solution has been analyzed by measuring the displacement of the laser-trapped probe. The amount of displacement is measured by detecting the intensity of light scattering at the probe illuminated by evanescent field. The sensitivity of 27 fN and the range of 5.2 pN have been achieved in the experiment with various concentrations of electrolyte trisaminomethane. The distribution of the surface force of 3-aminopropyltriethoxysilane coated on the glass substrate was also detected. © 2002 American Institute of Physics.