Cart (Loading....) | Create Account
Close category search window
 

A new extraction method for noise sources and correlation coefficient in MESFET

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jong-Hee Han ; Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea ; Kwyro Lee

A new extraction method for noise sources and correlation coefficient in the noise equivalent circuit of GaAs metal semiconductor field effect transistor (MESFET) is proposed. It is based on the linear regression, which allows us to extract physically meaningful parameters from the measurement in a systematic and straightforward way. The confidence level of the measured data can also be easily examined from the linearity, y-intercept of the linear regression, and the scattering from the regression line. Furthermore, it is found that the time constant of correlation coefficient whose value is almost the same as that of the transconductance should be considered to model noise parameters accurately. The calculated values of minimum noise figure, optimum impedance, and noise resistance using above approach, show excellent agreement with measurement for a typical MESFET device studied in this paper

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:44 ,  Issue: 3 )

Date of Publication:

Mar 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.