Cart (Loading....) | Create Account
Close category search window

Investigation of dislocation jump distance during creep of NaCl single crystals using nuclear magnetic resonance pulse techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Nuclear magnetic resonance pulse techniques are applied in situ to investigate the dynamics of mobile dislocations during creep deformation of NaCl single crystals. 23Na spin‐lattice relaxation rates were measured in the rotating frame (T) during compression creep of single crystals of NaCl along the [110] direction at 478 K and 20 MPa. The relaxation rates are evaluated from the spin‐echo height following a π/2 locking and 64° pulse sequence. The mean jump distance of the mobile dislocations, evaluated from the ratio of the signal heights without deformation and during creep, decreased with time/strain reaching a constant value at the onset of the steady‐state creep regime. The results are compared with the dislocation‐dislocation spacing, the subgrain size, and the jump distance predicted from creep models.

Published in:

Applied Physics Letters  (Volume:55 ,  Issue: 7 )

Date of Publication:

Aug 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.