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Optical reflectivity measurements using a laser plasma light source

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2 Author(s)
Bortz, M.L. ; Central Research and Development Department, E. I. duPont and de Nemours and Co., Wilmington, Delaware 19880 ; French, R.H.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.102335 

Light produced by a laser plasma light source (LPLS) is used to perform optical reflectivity measurements on single crystals from 5 to 40 eV in a single experiment. The intense continuum generated by the rare‐earth plasma allows a significantly higher resolution above 15 eV and extends the measurements to higher energies than those attainable with other laboratory based light sources. This is the first application of a LPLS to vacuum ultraviolet spectroscopy of solids and we demonstrate this capability on two insulating materials, α‐Al2O3 and MgAl2O4.

Published in:

Applied Physics Letters  (Volume:55 ,  Issue: 19 )

Date of Publication:

Nov 1989

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