Cart (Loading....) | Create Account
Close category search window

Electronic structure modification induced by ion irradiation during film growth of Cu and Pd

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Parmigiani, F. ; Centro Informazioni Studi Esperienze S.p.A., Materials Department, P. O. Box 12081, 20134 Milan, Italy ; Kay, E.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Cu and Pd thin films grown under particular conditions of ion irradiation exhibit a lattice spacing expansion and a high density of lattice defects. As a consequence of this crystallographic disorder the Fermi edge of these systems is located at a higher binding energy, while the electronic core levels are broadened and shifted upward ≊0.35 eV, as shown by x‐ray photoelectron spectroscopy measurements. This letter demonstrates that the electronic structure modifications observed in these materials can be accounted for on the basis of the measured lattice parameter and lattice disorder invoking an energy band structure model for fcc metals and self‐consistent field wave function computations.

Published in:

Applied Physics Letters  (Volume:53 ,  Issue: 25 )

Date of Publication:

Dec 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.