By Topic

Surface, interface, and bulk properties of amorphous carbon films characterized by in situ ellipsometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
1 Author(s)
Collins, R.W. ; BP America Research and Development, 4440 Warrensville Center Road, Cleveland, Ohio 44128

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Hydrogenated amorphous carbon film growth in diamond‐like and polymer‐like forms has been studied by in situ ellipsometry. The experiments provide accurate values of the optical functions, thickness, and deposition rate in real time. Reactions between the substrate and the gas phase species or film in the initial stages of growth, inaccessible to ex situ probes, have been detected with monolayer resolution. Monolayer changes in near‐surface bonding have also been detected.

Published in:

Applied Physics Letters  (Volume:52 ,  Issue: 24 )