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Parameter estimation in Markov random field contextual models using geometric models of objects

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2 Author(s)
S. G. Nadabar ; Innovision Corp., Madison, WI, USA ; A. K. Jain

We present a new scheme for the estimation of Markov random field line process parameters which uses geometric CAD models of the objects in the scene. The models are used to generate synthetic images of the objects from random view points. The edge maps computed from the synthesized images are used as training samples to estimate the line process parameters using a least squares method. We show that this parameter estimation method is useful for detecting edges in range as well as intensity edges. The main contributions of the paper are: 1) use of CAD models to obtain true edge labels which are otherwise not available; and 2) use of canonical Markov random field representation to reduce the number of parameters

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IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:18 ,  Issue: 3 )