By Topic

An improved hierarchical test generation technique for combinational circuits with repetitive sub-circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
D. R. Chakrabarti ; Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India ; A. Jain

An improved hierarchical testing algorithm for combinational circuits with repetitive sub-circuits using the bus fault model has been proposed. This model exploits the regularity of a circuit by grouping together identical gate-level sub-circuits into high-level sub-circuits. Though the existing test generation techniques using this model reduces the required time substantially in many cases, it fails on encountering incompatibility between the inputs and outputs of high-level modules. The algorithm proposed helps in resolving high level incompatibility. The concept of a state transition graph has been used and it has been shown that resolving incompatibility at the high level is equivalent to finding a loop in the state transition graph. The technique is hierarchical in the sense that the original modeled high-level circuit is sub-divided into a number of components as soon as an incompatibility is encountered. The results of implementation of the algorithm for a class of combinational circuits indicate a significant reduction in the test generation time and complete fault coverage thus validating our technique

Published in:

Test Symposium, 1995., Proceedings of the Fourth Asian

Date of Conference:

23-24 Nov 1995