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Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing

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3 Author(s)
Takahashi, H. ; Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan ; Yanagida, N. ; Takamatsu, Y.

In this paper, we improve the previous method by enhancing a set of diagnostic tests and using an EB testing method. We first enhance the previous set of diagnostic tests to one of diagnostic tests consisting of the four sets, TP-1, TP-2, TP-3 and TP-4. We next present two diagnostic methods by using the enhanced diagnostic tests and an electron-beam tester (EB-tester). Experimental results show that the presented method identified fault locations within 0.2 to 5% of all stuck-at faults on all lines in the circuit by probing about 0.8 to 15% internal lines

Published in:

Test Symposium, 1995., Proceedings of the Fourth Asian

Date of Conference:

23-24 Nov 1995