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A cellular array designed from a Multiple-valued Decision Diagram and its fault tests

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3 Author(s)
N. Kamiura ; Fac. of Eng., Himeji Inst. of Technol., Japan ; Y. Hata ; K. Yamato

In this paper, we discuss easily testable cellular arrays that are constructed from Multiple-valued Decision Diagrams (MDD's). The cellular arrays consist of cells having simple switch functions. Since control inputs that specify switches of cells are determined easily by tracing paths activated in MDD's, our method for constructing cellular arrays is simple. We propose fault tests for multiple stuck-at faults of switch cells. We can locate any row having at least one faulty cell. We apply our array to the realizations of numerous binary and multiple-valued logic functions and compare our array with other cellular arrays

Published in:

Test Symposium, 1995., Proceedings of the Fourth Asian

Date of Conference:

23-24 Nov 1995