Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.94355
A method has been developed to minimize the background signal of retarding field analyzers. It uses a negative electrode or negative charge on an insulator to reflect the beam of a scanning electron microscope towards the detector. This beam simulates backscattered electrons so that the response of the detector can be studied and optimized.