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Test Program Generation for Communication Peripherals in Processor-Based SoC Devices

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5 Author(s)

Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 2 )

Date of Publication:

March-April 2009

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