It is shown that under many conditions the surface photovoltage (SPV) can be identified with Voc of a solar cell. Using a Kelvin probe to measure the SPV we have been able to determine several properties of silicon solar cells without recourse to a contact on the front surface and the attendant complications of resistive losses due to external currents. We have further used these techniques in conjunction with sputter etching to ’’profile’’ the potential through a single‐crystal solar‐cell junction and an amorphous silicon solar cell.
Published in:
Applied Physics Letters
(Volume:39
,
Issue:
3
)
Date of Publication:
Aug 1981
- Page(s):
-
258
-
260
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.92664
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Aug 1981