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Electrical characterization of solar cells by surface photovoltage

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4 Author(s)
Goldstein, Bernard ; RCA Laboratories, Princeton, New Jersey 08540 ; Redfield, David ; Szostak, Daniel J. ; Carr, Lester A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.92664 

It is shown that under many conditions the surface photovoltage (SPV) can be identified with Voc of a solar cell. Using a Kelvin probe to measure the SPV we have been able to determine several properties of silicon solar cells without recourse to a contact on the front surface and the attendant complications of resistive losses due to external currents. We have further used these techniques in conjunction with sputter etching to ’’profile’’ the potential through a single‐crystal solar‐cell junction and an amorphous silicon solar cell.

Published in:
Applied Physics Letters  (Volume:39 ,  Issue: 3 )

Date of Publication: Aug 1981

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