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Application of multiple observation time strategy in test generation of digital sequential circuits

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3 Author(s)
Skobtsov, Yu.A. ; CADS Dept., Donetsk Nat. Tech. Univ., Donetsk, Ukraine ; Skobtsov, V.Yu. ; Hindi, S.N.

The test generation method is designed for digital circuits with memory on the basis of distinguishing state pairs of good and fault devices. The multiple observation time test strategy, 16-valued alphabet and genetic algorithms are used . The proposed method permits to cover the faults that are not detected with traditional methods. It increases the fault coverage.

Published in:

CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of

Date of Conference:

24-28 Feb. 2009

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