Cart (Loading....) | Create Account
Close category search window
 

Comment on “Method to analyze electromechanical stability of dielectric elastomers” [Appl. Phys. Lett. 91, 061921 (2007)]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Norris, Andrew N. ; Mechanical and Aerospace Engineering, Rutgers University, Piscataway, New Jersey 08854, USA

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2833688 

The model of Zhao and Suo can be readily generalized to predict the critical breakdown electric field Ec of elastomers with arbitrary elastic strain energy function. An explicit expression for Ec is presented for elastomeric thin films under biaxial strain and comparisons are made with experimental data using a two term Ogden rubber elasticity model. Simplified results for uniaxial and for equibiaxial stress provide further insight into the electromechanical stability model.

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 2 )

Date of Publication:

Jan 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.