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Enhanced exchange bias in sub-50-nm IrMn/CoFe nanostructure

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4 Author(s)
Rahman, M.Tofizur ; Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan ; Shams, Nazmun N. ; Wang, Ding Shuo ; Lai, Chih-Huang

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The exchange bias field (Hex) of IrMn/CoFe deposited on a large-area nanoporous anodized alumina (AAO) is tailored by varying the pore density (D) and the network width (w) of AAO. The Hex increases with increasing D and reaches its maximum at D=5.6×1010 cm-2 and w∼28 nm. The enhancement in Hex, twice larger than that of the continuous film, is attributed to the reduction in antiferromagnetic (AFM) and ferromagnetic (FM) domain sizes. The suppression of Hex is observed for further increase in D, which may result from the excessive misalignment of AFM and FM spins and weakened AFM anisotropy.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 8 )

Date of Publication:

Feb 2009

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