Close category search window
 

Simulation and testing of a lateral, microfabricated electron-impact ion source

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Natarajan, S. ; Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708, USA ; Gilchrist, K.H. ; Piascik, J.R. ; Parker, C.B.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3046733 

Simulation and experimental testing of a miniaturized, lateral, electron-impact ionization source are reported. Modeling and subsequent optimization of the device design led to a tenfold improvement in the performance of the device in comparison with earlier designs. Increased electron current contributing to ionization and increased ion collection efficiency are believed to be the main factors responsible for this improvement. SIMION software was used to model the behavior of the devices and understand the improvement in performance. The ion source can operate in a wide pressure range from 0.1 to 100 mTorr and generate ion currents in excess of 1 μA.

Published in:
Applied Physics Letters  (Volume:94 ,  Issue: 4 )

Date of Publication: Jan 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.