By Topic

Multimode waveguide evanescent field fluorescence microscopy: Measurement of cell-substratum separation distance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hassanzadeh, Abdollah ; Department of Physics and Astronomy, The University of Western Ontario London, Ontario N6A 3K7, Canada ; Armstrong, Souzan ; Dixon, S.Jeffrey ; Mittler, Silvia

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3062977 

Waveguide evanescent field fluorescence microscopy allows imaging of thin films and contact regions between biological cells and their substratum. On changing the propagating waveguide mode exciting the fluorescence markers, the normalized evanescent field intensity at a specific distance from the waveguide surface is modified. This enables the determination of thin film thickness and cell-substratum separation distances. An extensive analysis of multimode ion-exchanged waveguides is presented, focusing on their applications as substrata for studying interfacial phenomena. The experimental results on Langmuir–Blodgett films are in excellent agreement with the simulations. For osteoblastic cells, close contacts were observed.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 3 )