By Topic

Secondary electron emission from MgO protective layer by Auger neutralization of ions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Uhm, H.S. ; Department of Molecular Science and Technology, Ajou University, Suwon 443-949, Republic of Korea ; Choi, Eun H. ; Cho, Guang S.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A theoretical model of the secondary electron emission yield (γ) from a MgO layer is developed based on the Auger neutralization of ions, resulting in an analytical expression of γ in terms of the ionization energy Ei for the density of states in the valence band, being an exponentially decaying function of the energy deviation from the band characteristic energy of 7.88 eV. The analytical expression recovers the previously known empirical formulation of γ∼(Ei-2φ) for the work function φ. Results of the theoretical model agree well with the measured data in terms of the data trend.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 3 )