Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3093814
A cantilever type has been developed for dynamic force microscopy by the addition of a harmonic oscillator in the form of a paddle to atomic force microscopy cantilevers. These cantilevers provide resonant amplification of periodic interactions between the probe and the substrate when the laser is aligned on the paddle. The cantilevers were explored for their use in piezoresponse force microscopy. Application of the cantilevers for measurements on periodically poled lithium niobate ferroelectric material is presented. A comparison with commonly used cantilevers showed an as good as or better performance of the presented cantilevers.