Cart (Loading....) | Create Account
Close category search window

The dielectric response of the H2Ti3O7 nanotube investigated by valence electron energy loss spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wang, Juan ; Department of Physics, The Chinese University of Hong Kong, Shatin, New Territory, Hong Kong ; Li, Quan ; Peng, L.-M. ; Malac, Marek

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The dielectric response of an anisotropic nanostructure, individual H2Ti3O7 nanotube with ∼8–10 nm diameter, has been investigated using both momentum transfer dependent and spatially resolved valence electron energy loss spectroscopies. The dielectric response of an individual nanotube is found to be dominated by several surface related excitations and defect states, although its basic electronic structure (such as the band gap and single electron interband transitions) is similar to that of TiO2. The possible origins of the surface excitations in such a tubular structure are also discussed.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 1 )

Date of Publication:

Jan 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.