By Topic

Thickness-dependent structural and electrical properties of multiferroic Mn-doped BiFeO3 thin films grown epitaxially by pulsed laser deposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2969785 

Thickness dependence of structural and electrical properties of multiferroic Mn-doped BiFeO3 (BFMO) thin films, grown on SrTiO3 (001) substrates with a bottom electrode of SrRuO3, was investigated. Very good ferroelectric properties were obtained in the thicker BFMO films with a typical remanent polarization of ∼65 μC/cm2, while ferroelectric polarization switching was too difficult to detect using a conventional technique in the thinnest BFMO films due to a much higher coercive field and an increase in the tunneling current. Their ferroelectric nature, however, was demonstrated by piezoresponse force microscopy, and excellent insulating properties and homogeneity were achieved in the films.

Published in:

Applied Physics Letters  (Volume:93 ,  Issue: 8 )