We have studied pyroelectric and ferroelectric properties of Pb(Zr,Ti)O3 thin films grown epitaxially on SrTiO3(001) substrates by rf magnetron sputtering. The pyroelectric coefficient was measured in the temperature range from 280 to 370 K using the Byer–Roundy method. Values as high as 48 nC/cm2 K have been obtained at 300 K. The PZT thin films exhibited a remanent polarization of 45–58 μC/cm2. The improved pyroelectric coefficient was attributed to a high crystalline quality of the films, as revealed by x-ray diffraction that showed only (001)-oriented perovskite PZT phase and a ω-rocking curve full width at half maximum value as low as 4.2 arc min for 300 nm thick films.
Published in:
Applied Physics Letters
(Volume:93
,
Issue:
5
)
Date of Publication:
Aug 2008
- Page(s):
-
052913
-
052913-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.2969778
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Aug 2008